MUTAH University

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    About Me

    • 00962 79 12345678
    • 009620 1234567
    • zdtarawneh@mutah.edu.jo
    • https://academic.mutah.edu.jo/zdtarawneh
    • Al Karak - Mutah

    " Ziyad A. Al Tarawneh is an associate professor in the Electrical Engineering Department of Mu’tah University. He received his B.Sc. degree in electrical engineering from Damascus University, Syria, in 2004. He has received his M.Sc. and Ph.D. degrees in Microelectronics Engineering from Newcastle University, United Kingdom, in 2007 and 2011 respectively. His current research interests include circuit reliability, asynchronous circuit design, low-power VLSI design, Solar cell designs and Wireless optical sensor netwoks."

    Research Interest

    Optical wireless sensor networks
    Solar Cells
    Asynchronous circuit design
    Circuit reliability
    Time Mode Circuits
    Low-power VLSI design
    IoT

    Published Research

    Modelling and Analysis of Manufacturing Variability Effects from Process to Architectural Level Integrated Circuit and System Design. Journal : Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation. PATMOS 2012. Lecture Notes in Computer Science. , Volume : 7606, pp 11-20Publisher : Springer , 2013
    Design of In-line Test Structure for MOSFET Strain Measurements, Journal : European Journal of Scientific Research , Volume : Vol. 119, pp.151-162. Publisher : European Journal of Scientific Research , 2014
    Soft Error Analysis of Multi-Gate Journal : World Applied Sciences Journal , Volume : Vol 32, no 4, pp.661-666Publisher : IDOSI Publications , 2014
    An analysis of SEU robustness of C-element structures implemented in bulk CMOS and SOI technologies Journal : International Conference on Microelectronics (ICM) , Volume : pp. 280-283Publisher : IEEE , 2010
    An Analysis of the Effect of Process Variations on Performance of C-Element Structures Implemented in Bulk CMOS and SOI Technologies Journal : 2nd European Workshop on CMOS variability, Grenoble, France. , Volume : Publisher : European Workshop on CMOS variability , 2011
    Statistical leakage power modeling of manufacturing process variations at system level Journal : IEEE.Power Engineering and Automation Conference (PEAM) , Volume : pp. 1-4.Publisher : IEEE , 2012
    On Metastability Resilience of Multi-Gate MOSFETs Journal : Jordan Journal of Electrical Engineering (JJEE) , Volume : vol. 1, no. 2, pp. 83-92.Publisher : Scientific Research and Graduate Studies at Tafila Technical University, Jordan , 2015
    Time Amplifier Based on Metastability-Dependent Time to-Voltage Converter Journal : Information Journal , Volume : Vol. 20, Iss. 4A, pp.2455-2468.Publisher : International Information Institute (Tokyo) , 2017
    Wide Range Time Difference Amplifier (WR-TDA) Journal : Jordan Journal of Electrical Engineering (JJEE) , Volume : vol. 4, no. 1, pp. 49-61Publisher : Scientific Research and Graduate Studies at Tafila Technical University, Jordan , 2018

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