| Wide Range Time Difference Amplifier (WR-TDA) | Ziyad Al Tarawneh
| Jordan Journal of Electrical Engineering (JJEE) | vol. 4, no. 1, pp. 49-61 | Scientific Research and Graduate Studies at Tafila Technical University, Jordan | | Journal | 2018 |
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| Time Amplifier Based on Metastability-Dependent Time to-Voltage Converter | Ziyad Al Tarawneh | Information Journal | Vol. 20, Iss. 4A, pp.2455-2468. | International Information Institute (Tokyo) | | Journal | 2017 |
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| On Metastability Resilience of Multi-Gate MOSFETs | Ziyad Al Tarawneh
| Jordan Journal of Electrical Engineering (JJEE) | vol. 1, no. 2, pp. 83-92. | Scientific Research and Graduate Studies at Tafila Technical University, Jordan | | Journal | 2015 |
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| Design of In-line Test Structure for MOSFET Strain Measurements, | Ziyad Al Tarawneh
| European Journal of Scientific Research | Vol. 119, pp.151-162. | European Journal of Scientific Research | | Journal | 2014 |
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| Soft Error Analysis of Multi-Gate | Ziyad Al Tarawneh | World Applied Sciences Journal | Vol 32, no 4, pp.661-666 | IDOSI Publications | Click Here | Journal | 2014 |
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| Modelling and Analysis of Manufacturing Variability Effects from Process to Architectural Level Integrated Circuit and System Design. | Chenxi Ni, Ziyad Al Tarawneh, Gordon Russell, and Alex Bystrov
| Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation. PATMOS 2012. Lecture Notes in Computer Science. | 7606, pp 11-20 | Springer | Click Here | Journal | 2013 |
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| Statistical leakage power modeling of manufacturing process variations at system level | C. Ni, Z. A. Tarawneh, G. Russell and A. Bystrov | IEEE.Power Engineering and Automation Conference (PEAM) | pp. 1-4. | IEEE | Click Here | Conference | 2012 |
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| An analysis of SEU robustness of C-element structures implemented in bulk CMOS and SOI technologies | Z. Al Tarawneh, G. Russell, and A. Yakovlev | International Conference on Microelectronics (ICM) | pp. 280-283 | IEEE | Click Here | Conference | 2010 |
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| An Analysis of the Effect of Process Variations on Performance of C-Element Structures Implemented in Bulk CMOS and SOI Technologies | Z. Al Tarawneh , G. Russell, and A. Yakovlev | 2nd European Workshop on CMOS variability, Grenoble, France. | | European Workshop on CMOS variability | | Conference | 2011 |
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