MUTAH University
Published Research
Research TitleAuthorsJournalVolume & Page NumbersPublisherDOITypeYearAbstract
Research TitleAuthorsJournalVolume & Page NumbersPublisherDOITypeYearAbstract
Wide Range Time Difference Amplifier (WR-TDA)Ziyad Al Tarawneh Jordan Journal of Electrical Engineering (JJEE)vol. 4, no. 1, pp. 49-61Scientific Research and Graduate Studies at Tafila Technical University, JordanJournal2018
Time Amplifier Based on Metastability-Dependent Time to-Voltage ConverterZiyad Al TarawnehInformation JournalVol. 20, Iss. 4A, pp.2455-2468.International Information Institute (Tokyo)Journal2017
On Metastability Resilience of Multi-Gate MOSFETsZiyad Al Tarawneh Jordan Journal of Electrical Engineering (JJEE)vol. 1, no. 2, pp. 83-92.Scientific Research and Graduate Studies at Tafila Technical University, JordanJournal2015
Design of In-line Test Structure for MOSFET Strain Measurements,Ziyad Al Tarawneh European Journal of Scientific ResearchVol. 119, pp.151-162. European Journal of Scientific ResearchJournal2014
Soft Error Analysis of Multi-GateZiyad Al TarawnehWorld Applied Sciences JournalVol 32, no 4, pp.661-666IDOSI PublicationsClick HereJournal2014
Modelling and Analysis of Manufacturing Variability Effects from Process to Architectural Level Integrated Circuit and System Design.Chenxi Ni, Ziyad Al Tarawneh, Gordon Russell, and Alex Bystrov Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation. PATMOS 2012. Lecture Notes in Computer Science. 7606, pp 11-20SpringerClick HereJournal2013
Statistical leakage power modeling of manufacturing process variations at system levelC. Ni, Z. A. Tarawneh, G. Russell and A. BystrovIEEE.Power Engineering and Automation Conference (PEAM)pp. 1-4.IEEEClick HereConference2012
An analysis of SEU robustness of C-element structures implemented in bulk CMOS and SOI technologiesZ. Al Tarawneh, G. Russell, and A. YakovlevInternational Conference on Microelectronics (ICM)pp. 280-283IEEEClick HereConference2010
An Analysis of the Effect of Process Variations on Performance of C-Element Structures Implemented in Bulk CMOS and SOI TechnologiesZ. Al Tarawneh , G. Russell, and A. Yakovlev2nd European Workshop on CMOS variability, Grenoble, France.European Workshop on CMOS variabilityConference 2011
Research TitleAuthorsJournalVolume & Page NumbersPublisherDOITypeYearAbstract